Eckert

James Eckert

Research Associate
Earth & Planetary Sciences

Bio

Microscale chemical analysis and imaging of rocks and materials (Electron Microprobe Analysis, EMPA); X-Ray Diffraction of rocks and materials (XRD). Metamorphic/igneous petrology: Pressure-temperature (P-T) determinations to constrain equilibration/crystallization conditions throughout the middle to lower crust (medium- to high-grade metamorphism), primarily of the southern Appalachians.  Structural geology and tectonics of metamorphic rocks. 

Relevant Information

An electron microprobe is a versatile instrument that bombards a small sample with a beam of high- energy electrons. Specimens usually are polished (especially for quantitative analysis) and must be coated with a thin film of carbon or metal to prevent the buildup of an electrical charge. This electron beam excites the specimen to produce physical effects that can be used to extract various types of microscale information (see details below). These effects range from atomic density (indicated by an effect known as “backscattered electrons”) to elemental abundance. The concentration of an element can be shown in a map of the specimen or can be quantified by comparison to standards with known amounts of the element. For quantitative analysis, the excited area of the specimen can be as small as about 2 microns in diameter; a micron is 1/1000 of a millimeter. Thus, very small areas can be analyzed chemically and those areas can be linked to the distribution of elements throughout the specimen. This detailed information can be applied to science and engineering fields as diverse as geology, archeology, materials science, metallurgy, chemistry, physics, gemology, electronics, biology, medicine, dentistry, environmental science and engineering, and forensics, to name a few.

The microprobe also can function fully as an SEM, with most of the imaging capabilities thereof. Although the Yale JEOL 8600 lab concentrates primarily on quantitative microscale chemical analysis, secondary and backscattered electron imaging play an important role in evaluating the textural relationships of analyzed areas. In addition, some of the research in the lab uses primarily the SEM imaging capabilities. More details on the theory of electron imaging, including comparisons to resolution by optical and TEM analysis, should be available elsewhere. Unfortunately, the reference pages we had linked previously seem to have disappeared…

Kline Geology Laboratory Room 327, P.O. Box 208109, New Haven, CT 06520-8109 203-432-3181

NSF Instrument Upgrade (IF/EAR-0744154) and Yale University Fund Installation of JEOL JXA-8530F


The JEOL JXA-8530F (FEG) “Hyperprobe” now is installed; testing toward appropriate behavior and consistency continues. This electron probe microanalyzer (EPMA; aka electron microprobe analyzer, EMPA) permits imaging of features as small as 5-10 nanometers and quantitative analytical (chemical) resolution of features perhaps as small as 200 nm (~800 nm @10 kV). This analytical resolution applies to both quantitative analysis and extremely high-resolution chemical mapping. UPDATE: At present, our capabilities for microprobe analysis are complete, though some sporadic stability problems remain with software, communications, and beam current. We are accomplishing numerous sessions as time is available, including WDS quantitative work, electron imaging, EDS qualitative inspections, qualitative WDS scans, and sample chemical mapping (including WDS). 

We invite your interest in our electron microprobe/SEM facility. For more information, please contact Jim Eckert using the information at the bottom of this page. With this system we are able to acquire data with the native JEOL interface. We also plan ultimately to regain the ability to acquire data with the Probe-for-Windows software we used previously with the JXA-8600; apparently this still shall be a while coming.

The Yale Microprobe Facility (Geology and Geophysics)

The Yale University microprobe facility houses a JEOL JXA-8530F (FEG) “Hyperprobe” - electron probe microanalyzer (EPMA; aka electron microprobe analyzer, EMPA) - installation of which began in April 2009. This EPMA/SEM functions with state-of-the-art imaging, analytical, and computer-control capabilities. This probe configuration includes five wavelength-dispersive spectrometers (WDS) and a light-element-capable energy-dispersive spectrometer (EDS) with Windows-XP processing software. Hardware and software allow automated operation and data collection, and software accommodates advanced image processing and feature analysis.

Uses of the Microprobe, 1. Imaging

Since the microprobe functions also as a scanning electron microscope (SEM), in addition to element maps of a specimen, images from secondary electrons (SEI) and back-scattered electrons (BSE, a.k.a. COMPO or BEI) also can be produced. The Yale JXA-8530F rivals or surpasses most SEMs in the ability to resolve detail and represent with clarity the textural relationships in a specimen. This capability, coupled with the quantitative analysis described below, permits detailed microscale to nanoscale assessment of a specimen. SEM imaging with the 8530F can routinely apply magnifications over 50,000X. 

Uses of the Microprobe, 2. Microscale Chemistry
QUALITATIVE ANALYSIS

Qualitative and semi-quantitative microscale chemistry can be assessed rapidly using EDS spectrometry. This can benefit phase identification and recognition of compositional variability in a sample. This allows rapid imaging and compositional mapping, as well as storage of images and data in readily transferable formats. With either the native JEOL acquisition software or with Probe for Windows, we also can accommodate integration of EDS data into the quantitative-analysis package.

QUANTITATIVE ANALYSIS

Quantitative microscale chemical analysis, using wavelength dispersive spectrometry (WDS), requires both a stable, well-tuned instrument and standards for comparison that are both well characterized and appropriate for a given specimen. The JXA-8530F is proving to be a very stable instrument, and the Yale suite of available standards is quite diverse and extensive. Typical operating conditions for the electron beam are an accelerating voltage of 15 kV beam currents of 5 to 20 nanoamps, and beam diameter of 5 to 10 microns. However, these parameters can be varied widely (0.5 - 30 kV, ~10 pA to ~1500 nA) to address various questions. Many of the Yale standards, a collection begun by Horace Winchell in the 1960’s, are appropriate representatives of their mineral group. These generally high quality standards, which include both synthetic and naturally occurring varieties, have been graciously provided by a wide variety of esteemed scientists over several decades. Nonetheless, alternative standards for less traditional projects also can be applied.

Quantitative analysis can address all elements heavier than beryllium (boron and higher). Each analysis takes several minutes to count the X-rays and perform related calculations. Ultimate WDS detection limits for sodium and heavier elements are about 50 to 100 ppm (0.005 to 0.01 wt%, elemental); for lighter elements, the instrument is somewhat less sensitive. For most major elements, these truly quantitative microscale chemical measurements typically have accuracy and precision on the order of 1%. Comprehensive setups applied heretofore include a 33-element oxide setup, incorporating all REE with overlaps and interferences. Automated analysis allows the operator to assign locations for analysis during a session, then acquire data automatically (unattended) at those stored locations. Thus, the operator may concentrate on other tasks while the time-consuming X-ray counting and data reduction are completed. Data can be transferred via network or USB connections for rapid accommodation into reports and manuscripts.

Appropriate Specimens

Appropriate specimens for microprobe imaging and analysis can be geological, biological, or technical materials of various compositions and textures. To be appropriate, specimens must be:

  • solid and dry with a clean surface
  • stable in a vacuum and under a high-voltage electron beam (some less stable materials can be evaluated under less intense voltage and current, though this limits quantitative potential)
  • polished on the flat upper surface (for quantitative analysis) - this can be completed in the lab here, if needed
  • mounted on either:
    1) 25.4 mm (1”) diameter cylindrical blocks, plates, or discs;
    2) 27 mm wide (standard petrographic {U.S.}) glass slides or thin (~1 mm) plates up to 80 mm long (45 mm standard);
    3) another substrate no more than 100 mm X 100 mm and 25 mm thick (high)
  • able to conduct an electrical current or to be coated with a thin layer of conductive carbon (coating ideally performed in the lab here).
Access

Current hourly usage rates are available here. We encourage use by both academic and corporate institutions; please contact Jim Eckert if you have an interest in this facility. Operating time may be arranged as available. However, at least 1.5 or 2-week advance scheduling always is recommended, especially if any training or operator assistance may be required.  
PLEASE BE ADVISED: Scheduling “crises”, requiring immediate analysis, generally cannot be accommodated on short notice; if possible, please plan ahead. Thank you.

For the Upcoming Schedule, Yale-Microprobe Calendar, click here

Contact Info

yu1a.ggsite4@mailnull.com

+1(203) 432-3181

Office Address: KGL 327

Mailing address: PO Box 208109, New Haven CT 06520-8109
Street address: 210 Whitney Ave, New Haven CT 06511